Microscope
Scanning Probe Microscope
AFM/STM modes in one System
Featuring an innovative ergonomic design and advanced electronics, our Scientific Microscope delivers atomic-scale resolution for the cost, the price is perhaps the most surprising feature and make this microscope even more attractive.
Our Educational model makes it an ideal choice for education as well as research, The NAMA-SPM offers educators an exceptional microscope for their students with this powerful SPM/AFM-STM techniques.
Atomic Force Microscope Features
Modes
Constant Force: constant Height option: Zero contact: Semi Contact:
Force Spectroscopy
Microscopy
LFM: Lateral Force: MFM: Magnetic Force: MFM: Magnetic Force: PDM: Phase Detection: FMM: Force Modulation
STM mode
Constant Height: Constant Current
Lithography
Spectroscopy
Educational model
Scanning tunneling Microscope
Especially designed and manuctured for the Educationa areas of research, Robust, flexible and easy to understand. A great aid for the lecturer and learning facilitator to aid the exporation of the atomic world, with image of atoms, nanosctructures, Nano-morphology fo conductiong surfaces.
Applications
Technical Specifications
Scanning Probe Technical Specifications
Applications
Applications
Biological
Non Biological
Atomic: Scale imaging solid surface
Atom and Nano Structure manipulation
Spectroscopy of sample at desired area
Opto-electronics
Surface materials
semiconductor
Chemistry
Solid-state physics
Medicine
plus many more to mention
Technical Specifications
Atomic Force Technical Specifications
X,Y Scanning 30 micrometre
Z scanning 5 micrometre
lateral resolution 0.13nanometre
Vertical Resolution 0.05 nanometre
Scanning method: Movable sample under stationary probe
Piezo Ceramic type scanner
Maximum sample size: 20 mm
XY Micro positioning stage step: 2.5 micrometres
Embedded video system: visualization on PD via USB port
DAC/ADC resolution 16 bit
CE conformity
Scanning Probe Technical Specifications
Scanning probe Technical Specifications
X,Y Scanning 30 micrometre
Z scanning 5 micrometre
lateral resolution 0.13nanometre
Vertical Resolution 0.05 nanometre
Scanning method: Movable sample under stationary probe
Piezo Ceramic type scanner
Maximum sample size: 20 mm
XY Micro positioning stage step: 2.5 micrometres
Embedded video system: visualization on PD via USB port
DAC/ADC resolution 16 bit
CE conformity